test
test
test
test
test
ICs Operationsverstärker
LM3900N
0 st.
DIP14
4-fach
0.5 V/µs
LM13700N
1 st.
DIP16
2-fach
50 V/us
LM324
2 st.
DIP14
4-fach
0.5 V/us
LM741
1 st.
DIP8
1-fach
1 MHz
TL074
7 st.
DIP14
4-fach
3 MHz
TL072
12 st.
DIP8
2-fach
4 MHz
TL072
3 st.
SO-8
2-fach
4 MHz
test
ICs
6N137
3 st.
DIP8
5kV
Optokoppler
24LC128
1 st.
DIP8
128 Kb
EEPROM
74HC595
2 st.
DIP16
8bit
ShiftRegister
74HC595
2 st.
SO-16
8bit
ShiftRegister
CD40106
1 st.
DIP14
S.Trigger
Inverter
NE555
1 st.
DIP8
IC
Präzisionstimer
CD4051BE
4 st.
DIP16
8-Kanal
Multiplex
LM339
3 st.
DIP14
4-fach
Kompar.
PT2399
10 st.
DIP16
CMOS
delay
HC4050
2 st.
SO-16
CMOS
Buffers
HCF4015
0 st.
SO-16
CMOS
S REG
HEF4016
0 st.
SO-16
HEF4081
0 st.
SO-16
CMOS
Gates
DAC0808
1 st.
DIP16
DAC
8BIT